The cut-maps described in section 3.4 works very well on
single tag data, and a purity over 85% in the data can be
achieved after the cuts. The double tag case is harder to deal
with as the main background is a single tag
plus an
off-energy electron. This background is not as confined as the
pure off-energy electron background, and the cut-maps will be less
effective. Applying the cut-maps on both of the electrons in a
double tag event is however the best approach to reject the most
of this background.
A purity over 75% in the final sample is desirable in order to
get good quality of the data. The cut limit for the outer and
inner modules were set to 0.15 and 0.5 respectively
(removing all events that hit the cutmap in bins with
more than 0.15/0.5 permill of the background signal).
An average purity of 75% was then obtained, with only
a 36% loss of the
signal (Table 5.3).
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The cuts used on data also have to be used on the Monte Carlo in order to get comparable results. As mention in section 3.4, the cut-maps are run-dependent as the y-position of the off-energy background changes. Monte Carlo has a fixed beam position over the whole year, and therefore an average fixed Y-value had to be used.